Mean shift: a robust approach toward feature space analysis

Comaniciu, D; Meer, Daniel P

doi:10.1109/34.1000236

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Mean shift: a robust approach toward feature space analysis

Author(s): D. Comaniciu , P. Meer

Publication date (Print): May 2002

Journal: IEEE Transactions on Pattern Analysis and Machine Intelligence

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

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Journal

Title: IEEE Transactions on Pattern Analysis and Machine Intelligence

Abbreviated Title: IEEE Trans. Pattern Anal. Machine Intell.

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 01628828

Publication date (Print): May 2002

Volume: 24

Issue: 5

Pages: 603-619

Article

DOI: 10.1109/34.1000236

PubMed ID: 21428083

SO-VID: 0c8d1c45-6237-4f08-8cc0-2bf331d0f213

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