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      Practical aspects of monochromators developed for transmission electron microscopy

      review-article
      Author(s): *
      Publication date (Electronic):
      Journal: Microscopy
      Publisher: Oxford University Press
      Keywords: monochromator, TEM, STEM, EELS, energy resolution, spatial resolution

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          Abstract

          A few practical aspects of monochromators recently developed for transmission electron microscopy are briefly reviewed. The basic structures and properties of four monochromators, a single Wien filter monochromator, a double Wien filter monochromator, an omega-shaped electrostatic monochromator and an alpha-shaped magnetic monochromator, are outlined. The advantages and side effects of these monochromators in spectroscopy and imaging are pointed out. A few properties of the monochromators in imaging, such as spatial or angular chromaticity, are also discussed.

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          Electron Energy-Loss Spectroscopy in the Electron Microscope

          R.F. Egerton (2011)
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            Quantitative atomic resolution scanning transmission electron microscopy.

            James M. LeBeau, Scott Findlay, Leslie Allen … (2008)
            Complete understanding of atomic resolution high-angle annular dark-field (Z-contrast) images requires quantitative agreement between simulations and experiments. We show that intensity variations can be placed on an absolute scale by normalizing the measured image intensities to the incident beam. We construct fractional intensity images of a SrTiO3 single crystal for regions of different thickness up to 120 nm. Experimental images are compared directly with image simulations. Provided that spatial incoherence is taken into account in the simulations, almost perfect agreement is found between simulation and experiment.
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              Transmission Electron Microscopy

              Ludwig Reimer (1997)
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                Author and article information

                Journal
                Journal ID (nlm-ta): Microscopy (Oxf)
                Journal ID (iso-abbrev): Microscopy (Oxf)
                Journal ID (publisher-id): jmicro
                Journal ID (hwp): jmicro
                Title: Microscopy
                Publisher: Oxford University Press
                ISSN (Print): 2050-5698
                ISSN (Electronic): 2050-5701
                Publication date (Print): October 2014
                Publication date (Electronic): 14 August 2014
                Publication date PMC-release: 14 August 2014
                Volume: 63
                Issue: 5
                Pages: 337-344
                Affiliations
                Electron Microscopy Group, National Institute for Materials Science , 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
                Author notes
                [* ]To whom correspondence should be addressed. E-mail: kimoto.koji@ 123456nims.go.jp
                Article
                Publisher ID: dfu027
                DOI: 10.1093/jmicro/dfu027
                PMC ID: 4710459
                PubMed ID: 25125333
                SO-VID: 07602630-24c1-4d1d-8062-2bb15fb1f47b
                Copyright © © The Author 2014. Published by Oxford University Press on behalf of The Japanese Society of Microscopy.
                License:

                This is an Open Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License ( http://creativecommons.org/licenses/by-nc/4.0/), which permits non-commercial re-use, distribution, and reproduction in any medium, provided the original work is properly cited. For commercial re-use, please contact journals.permissions@oup.com

                History
                Date received : 1 July 2014
                Date accepted : 14 July 2014
                Categories
                Subject: Review

                Keywords: monochromator,tem,stem,eels,energy resolution,spatial resolution
                Data availability:
                Keywords: monochromator, tem, stem, eels, energy resolution, spatial resolution

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