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Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography
Author(s):
M Herbig
,
P. Choi
,
D. Raabe
Publication date:
2015-06-01
Journal:
Ultramicroscopy
Publisher:
Elsevier BV
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Atomic Force Microscopy
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Journal
DOI::
10.1016/j.ultramic.2015.02.003
License:
https://www.elsevier.com/tdm/userlicense/1.0/
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