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      Thickness Dependence of Resistivity and Optical Reflectance of ITO Films

      Author(s): , , ,
      Publication date (Electronic):
      Journal: Chinese Physics Letters
      Publisher: IOP Publishing

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          Effect of film thickness on the properties of indium tin oxide thin films

          C. Gilmore, Z. Kafafi, D. Chrisey … (2000)
          Article 0 comments Cited 48 times – based on 0 reviews     Review now
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            A study of low temperature crystallization of amorphous thin film indium–tin–oxide

            T. Whitson, Brian Lewis, Cleva Yang … (1999)
            Article 0 comments Cited 33 times – based on 0 reviews     Review now
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              Crystallization and electrical property change on the annealing of amorphous indium-oxide and indium-tin-oxide thin films

              Hiroshi Morikawa, Miya Fujita (2000)
              Article 0 comments Cited 17 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Chinese Physics Letters
                Abbreviated Title: Chinese Phys. Lett.
                Publisher: IOP Publishing
                ISSN (Print): 0256-307X
                ISSN (Electronic): 1741-3540
                Publication date Created: April 01 2008
                Publication date (Print): April 2008
                Publication date (Electronic): April 10 2008
                Volume: 25
                Issue: 4
                Pages: 1380-1383
                Article
                DOI: 10.1088/0256-307X/25/4/059
                SO-VID: ce984e36-1acb-4f75-b46c-0c34b1b33bc2
                Copyright © © 2008
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