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      Metal streak artifacts in X-ray computed tomography: a simulation study

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          Journal
          IEEE Transactions on Nuclear Science
          IEEE Trans. Nucl. Sci.
          Institute of Electrical and Electronics Engineers (IEEE)
          00189499
          June 1999
          : 46
          : 3
          : 691-696
          Article
          10.1109/23.775600
          7ffa6d3c-78f3-4e2f-8b2d-314d883532bd
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