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      Bias‐stress‐induced stretched‐exponential time dependence of charge injection and trapping in amorphous thin‐film transistors

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      Applied Physics Letters
      AIP Publishing

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          Hopping exponential band tails.

          (1985)
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            Theory of trap-controlled transient photoconduction

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              Defect pool in amorphous-silicon thin-film transistors

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                March 15 1993
                March 15 1993
                : 62
                : 11
                : 1286-1288
                Article
                10.1063/1.108709
                0eab1c99-eb82-46b4-9645-c8a8d411e807
                © 1993
                History

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